OpenAccessBelV2, OpenAccess, Analysis, bibRecord, 000097

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Identifieur interne : 000097 ( OpenAccess/Analysis ); précédent : 000096; suivant : 000098

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Auteurs : Edgar F. Rauch [France] ; Joaquin Portillo [Belgique, Espagne] ; Stavros Nicolopoulos [Belgique] ; Daniel Bultreys [Belgique] ; Sergei Rouvimov [Espagne] ; Peter Moeck [États-Unis]

Source :

Zeitschrift für Kristallographie [ 0044-2968 ] ; 2010.

RBID : Pascal:10-0173472

Descripteurs français

Pascal (Inist)
- Nanocristal, Nanomatériau, Microscopie électronique transmission, Diffraction électron, Réseau réciproque, Diagramme diffraction, Faisceau électron, Orientation cristalline, Base de données, 8107B, 6146, 6114L, 6168.
Wicri :
- topic : Base de données.

English descriptors

KwdEn :
- Crystal orientation, Database, Diffraction pattern, Electron beams, Electron diffraction, Nanocrystal, Nanostructured materials, Reciprocal lattice, Transmission electron microscopy.

Abstract

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.

Affiliations:

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Pascal:10-0173472

Le document en format XML

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<front><div type="abstract" xml:lang="en">An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.</div>
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Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Links to Exploration step

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri